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ProductsOur products cover axial diodes, surface mount bridge rectifiers, photovoltaic modules, etc., and are widely used in fields such as power electronics, aerospace, and industrial automation.
Qualification & Honor
- National High-Tech Enterprise
- National Level Specialized and Innovative "Little Giant" Enterprise
- Excellent Private Enterprise in Anhui Province
- Anhui Province Worker Pioneer
- Provincial Engineering Research Center
- 32 Patents, Including 14 Invention Patents
- IATF16949 International Automotive Quality System Certification
- JXM65R099DC Has Obtained Vehicle Specification Certification
- AEC-Q101 Certification
- ISO9001 Quality Management System Certification
- ISO14001 Environmental Management System Certification
- ISO45001 Occupational Health and Safety System Certification
- Intellectual Property Management System Certification
- Certification of Social Responsibility Management System

IATF 16949:2016

AEC-Q101

GB/T39604-2020

GB/T 45001-2020
Product Reliability Test
No. | Experiment Item | Experiment Conditions | Time or Cycle | Reference |
1 | High Temperature Reverse Bias | TA=100±5℃,Bias=80%VR | 48H/168H/1000H | MIL-STD-750F METHOD-1038 |
2 | High Temperature Storage | TA=150±5℃ | 48H/168H/1000H | MIL-STD-750F METHOD-1031 |
3 | Intermittent Operation Life | ON=5Min with rated △TjF≥100℃ OFF=5Min with cool forced air | 1000/10000 CYCLE | MIL-STD-750F METHOD-1036 |
4 | Temperature Cycling (air to air) | TH=150+15/-0℃15Min TL=-55+0/-10℃15Min | 1000 CYCLE | MIL-STD-750F METHOD-1051 |
5 | Resistance to Soldering heat | 260±5℃ | 10±1 SEC | MIL-STD-750F METHOD-2031 |
6 | Terminal Strength* | 1Kg in axial lead direction | 10 SEC | MIL-STD-750F METHOD-2036 |
7 | Lead Fatigue* | 0.5Kg weight applied to lead bending are 90±5° | 3 TIMES | |
8 | Forward Surge Current | 8.3ms,Single half sine-wave superimposed on rated load | 1 PULSE | MIL-STD-750F METHOD-4066 |
9 | Unbiased Autoclave Test | TA=121±2℃,29.7PSIG, RH=100% | 96H/168H | JESD22-A102 |
10 | Solderability | 245±5℃ | 5 SEC | MIL-STD-750F METHOD-2026 |
11 | Low Temperature storage | -55±5℃ | 48H/168H/1000H | JESD22-A119 |
12 | High-temperature High-humidity Storage Test | 85±2℃, 85±5%RH | 168H/1000H | MIL-STD-202G METHOD-103B |
13 | Thermal Shock | TH=150+15/-0℃30Min TL=-55+0/-10℃30Min Transfer time≤3Min | 30 CYCLE | MIL-STD-750F METHOD-1051 |
14 | ESD | HBM, ±30KV | 1 CYCLE | AEC-Q101-001/002 |
15 | Bypass Diode Thermal Test | Rated J-Box Current 1.25times J-Box Current | 1 CYCLE | IEC 62790 |
16 | Thermal Runaway Test | 80% Rated Current 16V Reverse Bias | 1 CYCLE | IEC 62979 |
* For Axial Products Only.
Nantong JUXIN Semiconductor Co., Ltd.
Contact: Mr.Jacky
Address: No.196, East Qingyu Road, Rucheng Street, Rugao-226500, Jiangsu Province, China.
Phone(Wechat): +86-15190885420
Email: info@rectifier-diode.com
Anhui JUXIN Semiconductor Co., Ltd.
Address: No.2, Shuanglong Road, Electronic Information Industrial Park, Chizhou City, Anhui Province, China.
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