juxin

A high-quality supplier of power semiconductor chips and devices in China

Qualification & Honor


- National High-Tech Enterprise
- National Level Specialized and Innovative "Little Giant" Enterprise
- Excellent Private Enterprise in Anhui Province
- Anhui Province Worker Pioneer
- Provincial Engineering Research Center
- 32 Patents, Including 14 Invention Patents
- IATF16949 International Automotive Quality System Certification

- JXM65R099DC Has Obtained Vehicle Specification Certification
- AEC-Q101 Certification
- ISO9001 Quality Management System Certification
- ISO14001 Environmental Management System Certification
- ISO45001 Occupational Health and Safety System Certification
- Intellectual Property Management System Certification
- Certification of Social Responsibility Management System

IATF 16949:2016

IATF 16949:2016

AEC-Q101

AEC-Q101

GB/T39604-2020

GB/T39604-2020

GB/T 45001-2020

GB/T 45001-2020

Product Reliability Test

No.

Experiment Item

Experiment Conditions

Time or Cycle

Reference

1

High Temperature Reverse Bias

TA=100±5℃,Bias=80%VR

48H/168H/1000H

MIL-STD-750F

METHOD-1038

2

High Temperature Storage

TA=150±5℃

48H/168H/1000H

MIL-STD-750F

METHOD-1031

3

Intermittent Operation Life

ON=5Min with rated

△TjF≥100℃ OFF=5Min

with cool forced air

1000/10000 CYCLE

MIL-STD-750F

METHOD-1036 

4

Temperature Cycling

(air to air) 

TH=150+15/-0℃15Min

TL=-55+0/-10℃15Min 

1000 CYCLE

MIL-STD-750F

METHOD-1051

5

Resistance to Soldering heat

260±5℃

10±1 SEC

MIL-STD-750F

METHOD-2031

6

Terminal Strength*

1Kg in axial lead direction

10 SEC

MIL-STD-750F

METHOD-2036

7

Lead Fatigue*

0.5Kg weight applied to lead bending are 90±5°

3 TIMES

8

Forward Surge Current

8.3ms,Single half sine-wave superimposed on rated load

1 PULSE

MIL-STD-750F

METHOD-4066

9

Unbiased Autoclave Test

TA=121±2℃,29.7PSIG,

RH=100%

96H/168H

JESD22-A102

10

Solderability

245±5℃

5 SEC

MIL-STD-750F

METHOD-2026

11

Low Temperature storage

-55±5℃

48H/168H/1000H

JESD22-A119

12

High-temperature High-humidity Storage Test

85±2℃, 85±5%RH

168H/1000H

MIL-STD-202G

METHOD-103B

13

Thermal Shock

TH=150+15/-0℃30Min

TL=-55+0/-10℃30Min

Transfer time≤3Min

30 CYCLE

MIL-STD-750F

METHOD-1051

14

ESD

HBM, ±30KV  

1 CYCLE

AEC-Q101-001/002

15

Bypass Diode Thermal Test

Rated J-Box Current

1.25times J-Box Current 

1 CYCLE

IEC 62790

16

Thermal Runaway Test

80% Rated Current

16V Reverse Bias 

1 CYCLE

IEC 62979

* For Axial Products Only.

Nantong JUXIN Semiconductor Co., Ltd.

Contact: Mr.Jacky

Address: No.196, East Qingyu Road‌, Rucheng Street, Rugao-226500, Jiangsu Province, China.

Phone(Wechat): +86-15190885420

Email: info@rectifier-diode.com

 

Anhui JUXIN Semiconductor Co., Ltd.

Address: No.2, Shuanglong Road‌, Electronic Information Industrial Park, Chizhou City, Anhui Province, China.


Business License